Product Description:
In order to test access to potentially dangerous live elements in electrical and electronic equipment, such as industrial control panels and home appliances, the IEC 61032 Figure 2 Test Probe B (Jointed Test Finger) is a precise safety tool that mimics human finger movement. Its dual-jointed design allows it to transit gaps that rigid probes cannot reach by bending 90° (±10°) in the same plane and direction as a finger. Over-insertion is prevented by a 50mm diameter baffle plate, and live components are detected by a 12mm knurled metal tip. With an insulated handle and conductive stainless steel construction for durability and conductivity, it provides a moderate 10N thrust, which is essential for confirming safety and satisfying international accessibility requirements.
Specifications:
Standards: IEC 61032 Figure 2; IEC 60529 Figure 1
Probe Material: Conductive stainless steel (resistance ≤ 0.1Ω; corrosion-resistant; knurled tip for consistent contact)
Handle Material: Insulated ABS plastic (resistance ≥ 100MΩ; heat-resistant up to 120°C; ergonomic grip for precision)
Joint Characteristics: 2 pivot joints; max bending angle: 90° ± 10° (same plane/direction); no deformation under 10N thrust
Key Dimensions:
– Knurled Finger Diameter: 12mm ± 0.1mm
– Knurled Finger Length: 80mm ± 0.2mm
– Baffle Plate Diameter: 50mm ± 0.2mm
– Baffle Plate Thickness: 20mm ± 0.1mm
– Baffle Plate Length: 100mm ± 0.2mm
– Total Length (Probe + Handle): 300mm ± 0.5mm
Applied Thrust: 10N ± 0.5N (simulates light human finger contact; standard for accessibility testing)
Core Function: Mimics finger movement to test access to hazardous live parts; prevents over-insertion via baffle; ensures IEC 61032 compliance
