Industrial Testing Equipment
IP Test Finger Probe Kit for Enclosure Protection Testing
The IEC 60529 IP Test Probe Kit includes IP1X, IP2X, IP3X and IP4X probes for testing enclosure protection against access to hazardous parts and solid foreign objects. The kit includes a 50 mm test sphere, jointed test finger, 12.5 mm object sphere, 2.5 mm test rod and 1 mm test wire. Designed according to IEC 60529, IEC 61032 and GB/T 4208, it is suitable for electrical appliances, electronic equipment, control cabinets and laboratory testing.
IEC 60529 IP1X IP2X IP3X IP4X Test Probe Kit
The IEC 60529 IP Test Probe Kit is designed to test the protection provided by electrical equipment enclosures against access to hazardous parts and the ingress of solid foreign objects.
This complete kit includes IP1X, IP2X, IP3X and IP4X access probes and object probes. The probes simulate the back of a hand, human fingers, tools and metal wires during enclosure protection testing.
The kit is manufactured according to IEC 60529, IEC 61032 and GB/T 4208 requirements.
What Is Included in the Kit?
Probe | Type | Main Application |
|---|---|---|
IP1X Test Sphere Probe | Type A | Simulates the back of a hand and tests protection against large solid objects |
IP2X Jointed Test Finger | Type B access probe | Simulates a human finger and tests access to hazardous parts |
IP2X Object Sphere Probe | 12.5 mm sphere | Tests protection against solid foreign objects |
IP3X Test Rod | Type C | Simulates a tool or thick wire |
IP4X Test Wire | Type D | Simulates a thin metal wire |
Custom probe combinations and individual probes are available upon request.
IP1X–IP4X Probe Specifications
Probe | Simulated Object | Main Dimensions | Stop / Guard | Required Test Force | Applicable Standard |
|---|---|---|---|---|---|
IP1X Test Probe A | Back of hand / large solid object | Sphere diameter: 50 mm | Guard diameter: 45 mm; thickness: 4 mm | 50 N ± 10% | IEC 60529, IEC 61032, GB/T 4208 |
IP2X Jointed Test Finger B | Human finger | Finger length: 80 mm; maximum diameter: 12 mm | Stop face: 50 mm diameter × 20 mm | 10 N ± 10% | IEC 60529, IEC 61032 |
IP2X Object Probe | Solid foreign object | Sphere diameter: 12.5 mm | Guard diameter: 10 mm; thickness: 4 mm | 30 N ± 10% | IEC 60529, GB/T 4208 |
IP3X Test Probe C | Tool / thick wire | Rod diameter: 2.5 mm; length: 100 mm | Stop sphere diameter: 35 mm | 3 N ± 10% | IEC 60529, IEC 61032 |
IP4X Test Probe D | Thin metal wire | Wire diameter: 1.0 mm; length: 100 mm | Stop sphere diameter: 35 mm | 1 N ± 10% | IEC 60529, IEC 61032 |
Handle Dimensions
- Standard handle length: 100 mm
- Standard handle diameter: 10 mm
- Handle material: Insulating nylon
- Probe material: Stainless steel and insulating materials
- Optional force indicator and calibration accessories are available
IP Rating and Probe Selection Guide
IP Level | Probe Used | Protection Tested | Typical Test Requirement |
|---|---|---|---|
IP1X / IPXXA | 50 mm test sphere | Protection against access by the back of the hand and large objects | The sphere must not completely pass through the enclosure opening |
IP2X / IPXXB | Jointed test finger | Protection against access by fingers | The finger probe must not touch hazardous internal parts |
IP3X / IPXXC | 2.5 mm test rod | Protection against tools and solid objects ≥2.5 mm | The rod must not contact hazardous internal parts |
IP4X / IPXXD | 1.0 mm test wire | Protection against thin wires and solid objects ≥1.0 mm | The wire must not contact hazardous internal parts |
IP1X to IP4X refer to protection against solid foreign objects and access to hazardous parts. IP5X and IP6X are separate dust protection classifications and require dedicated dust testing methods.
How to Use IP Test Probes
- Select the appropriate probe according to the required IP protection level.
- Inspect the enclosure openings and identify all accessible openings.
- Insert or press the probe against the opening as specified by IEC 60529 or IEC 61032.
- Apply the specified test force using the probe force indicator or an external force gauge.
- Move the probe through all applicable directions and positions.
- For access-to-hazardous-parts testing, connect the probe to a low-voltage signal circuit, indicator lamp or measuring instrument when required.
- Observe whether the probe contacts hazardous internal parts.
- Record the test result and compare it with the acceptance criteria of the applicable standard.
The IP2X jointed test finger can be bent at its joints to simulate the movement of a human finger during testing.
Test Acceptance Criteria
Protection Against Access to Hazardous Parts
The test is considered compliant when:
- The probe does not contact hazardous internal parts.
- The specified clearance from hazardous parts is maintained.
- The indicator lamp does not illuminate when a signal circuit is used.
- The jointed IP2X finger cannot reach hazardous components through the enclosure opening.
Protection Against Solid Foreign Objects
The test is considered compliant when:
- The specified probe diameter cannot completely pass through the enclosure opening.
- The test probe does not reach hazardous internal parts.
- The enclosure provides the required level of protection under the applied test force.
The final acceptance result should always be determined according to the exact edition and test clauses of the applicable standard.
Applications
The IP1X–IP4X test probe kit is suitable for:
- Household electrical appliances
- Lighting products
- Power supplies and adapters
- Electrical control cabinets
- Switches and sockets
- Power tools
- Industrial control equipment
- Outdoor electrical products
- Electronic equipment enclosures
- Laboratory and quality-control testing
- Certification and compliance testing
Standards
This test probe kit is designed for testing requirements related to:
- IEC 60529 — Degrees of protection provided by enclosures
- IEC 61032 — Protection of persons and equipment by enclosures
- GB/T 4208 — Enclosure protection classification
- IPXXA, IPXXB, IPXXC and IPXXD access protection tests
FAQ
What is an IP test probe kit?
An IP test probe kit is a set of standardized probes used to evaluate whether an enclosure prevents access to hazardous parts and blocks the entry of specified solid foreign objects.
What probes are included in the IP1X–IP4X kit?
The standard kit includes an IP1X test sphere, an IP2X jointed test finger, an IP2X 12.5 mm object sphere, an IP3X test rod and an IP4X test wire.
What is the difference between the IP2X finger probe and the IP2X object probe?
The IP2X jointed finger probe tests protection against human finger access to hazardous parts. The 12.5 mm object probe tests protection against the entry of solid foreign objects.
What test force is required for each probe?
The typical test forces are 50 N for IP1X, 10 N for the IP2X jointed finger, 30 N for the IP2X object sphere, 3 N for IP3X and 1 N for IP4X. The exact tolerance depends on the applicable standard and test method.
Can the probes be supplied with calibration?
Yes. Calibration services and calibration certificates can be provided according to customer requirements.
Can I purchase individual probes instead of the complete kit?
Yes. Individual IP1X, IP2X, IP3X and IP4X probes can be supplied separately.
What is the difference between IP1X–IP4X and IP5X–IP6X testing?
IP1X–IP4X primarily evaluate protection against access to hazardous parts and solid foreign objects. IP5X and IP6X evaluate dust ingress and require dedicated dust test equipment and procedures.