IEC Test Finger Probe
IEC 62196 Electric Vehicle Connector Gauge A and B
1. According to : IEC 62196-1 Figure 15 2. The test probe is used for household and similar electrical appliances of necessary protection of against electric shock test apparatus; Gauge for checking non-accessibility of live parts, through shutters, and of live parts of socket-outlets with increased protection.
IEC 62196-1 Gauge A & Gauge B Shutters Test Gauges
Gauge A and Gauge B are dedicated test gauges designed, in accordance with IEC 62196-1, to verify the safety performance of the Shutters within charging Socket-outlets and Vehicle inlets.These gauges are engineered to two key objectives:
- Confirming the shutters’ ability to effectively prevent contact with live parts by unintended objects.
- Ensuring compliant plugs can be inserted smoothly, with the shutters activating automatically as designed.
Core Functions
Pursuant to Clause 10.2 of IEC 62196-1 (referencing Figures 9 and 10), these two gauges are used as a pair to conduct the following tests:
- Foreign Object Contact Simulation: Verifying the shutters’ resistance to accidental contact from small tools or fingers.
- Automatic Activation Validation: Ensuring the shutters open reliably when a specified plug is inserted.
Technical Specification Differences
Characteristic | Gauge A | Gauge B |
|---|---|---|
Test Force | 20 N | 1 N |
Primary Purpose | Evaluating the shutters’ mechanical strength to resist unauthorized insertion under significant pressure. | Simulating minor contact to validate the shutters’ reliable closure under minimal force. |
Operation Method | Apply 20 N force to the probe tip until the probe protrudes and the A-A plane is flush with the B-B plane. | Similar to Gauge A, but with a gentle 1 N force applied during testing. |
Application：
These gauges are primarily utilized by testing institutions and connector manufacturers to ensure products comply with the safety requirements of the IEC 62196 standard.